Deposition and characterization of layer-by-layer sputtered AgGaSe2 thin films

Karaagac H., Parlak M.

Applied Surface Science 257 13 (2011) 5731-5738

DOI: 10.1016/j.apsusc.2011.01.087

Electrical and interface state density properties of the 4H-nSiC/[6,6]-phenyl C61-butyric acid methyl ester/Au diode

M.E. Aydin, Fahrettin Yakuphanoglu

Microelectronic Engineering 85 (2008) 1836–1841

PL and XPS depth profiling of Si/Al2O3 co-sputtered films and evidence of the
formation of silicon nanocrystals

I. Dogan, I. Yildiz, R. Turan

Physica E 41 (2009) 976–981